The Transmission Electron Microscope
Theory and Applications

Contributor(s)
Maaz, Khan (editor)
Language
EnglishAbstract
This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.
Keywords
MicroscopyDOI
10.5772/59457Webshop link
https://www.intechopen.com/booksISBN
9789535121503, 9789535163848Publisher
IntechOpenPublisher website
https://www.intechopen.com/Publication date and place
2015Imprint
IntechOpenClassification
Industrial applications of scientific research and technological innovation

