Show simple item record

dc.contributor.editorMaaz, Khan
dc.date.accessioned2021-04-20T15:51:42Z
dc.date.available2021-04-20T15:51:42Z
dc.date.issued2015
dc.identifierONIX_20210420_9789535121503_2085
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/66726
dc.description.abstractThis book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.
dc.languageEnglish
dc.subject.classificationthema EDItEUR::P Mathematics and Science::PD Science: general issues::PDG Industrial applications of scientific research and technological innovationen_US
dc.subject.otherMicroscopy
dc.titleThe Transmission Electron Microscope
dc.title.alternativeTheory and Applications
dc.typebook
oapen.identifier.doi10.5772/59457
oapen.relation.isPublishedBy78a36484-2c0c-47cb-ad67-2b9f5cd4a8f6
oapen.relation.isbn9789535121503
oapen.relation.isbn9789535163848
oapen.imprintIntechOpen
oapen.pages360


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

https://creativecommons.org/licenses/by/3.0/
Except where otherwise noted, this item's license is described as https://creativecommons.org/licenses/by/3.0/