Phase-Contrast and Dark-Field Imaging

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https://www.mdpi.com/books/pdfview/book/1078
Author(s)
Simon Zabler (Ed.)
Language
English
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Abstract
The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
URI
https://directory.doabooks.org/handle/20.500.12854/56139
Keywords
X-ray scattering; Coded-aperture imaging; Talbot-Interferometer; Moiré pattern analysis; Electron Backscatter imaging; Dark-field imaging; Computed Tomography; cultural heritage; X-ray Phase-contrast imaging; medical imaging; image processing: Fourier image analysis
DOI
10.3390/books978-3-03897-285-3
Webshop link
https://play.google.com/books/ ...; https://www.mdpi.com/books/pdf ...
ISBN
9783038972846, 9783038972853
Publisher
MDPI - Multidisciplinary Digital Publishing Institute
Publisher website
www.mdpi.com/books
Publication date and place
2019
Classification
Mathematics & science
Pages
146
Rights
https://creativecommons.org/licenses/by-nc-nd/4.0/
https://creativecommons.org/licenses/by-nc-nd/4.0/
Except where otherwise noted, this item's license is described as https://creativecommons.org/licenses/by-nc-nd/4.0/