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Phase-Contrast and Dark-Field Imaging

dc.contributor.authorSimon Zabler (Ed.)*
dc.date.accessioned2021-02-11T22:46:45Z
dc.date.available2021-02-11T22:46:45Z
dc.date.issued2019*
dc.date.submitted2019-01-08 11:33:34*
dc.identifier29828*
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/56139
dc.description.abstractThe intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.*
dc.languageEnglish*
dc.subjectQA1-939*
dc.subjectQC1-999*
dc.subject.classificationbic Book Industry Communication::P Mathematics & scienceen_US
dc.subject.otherX-ray scattering*
dc.subject.otherCoded-aperture imaging*
dc.subject.otherTalbot-Interferometer*
dc.subject.otherMoiré pattern analysis*
dc.subject.otherElectron Backscatter imaging*
dc.subject.otherDark-field imaging*
dc.subject.otherComputed Tomography*
dc.subject.othercultural heritage*
dc.subject.otherX-ray Phase-contrast imaging*
dc.subject.othermedical imaging*
dc.subject.otherimage processing: Fourier image analysis*
dc.titlePhase-Contrast and Dark-Field Imaging*
dc.typebook
oapen.identifier.doi10.3390/books978-3-03897-285-3*
oapen.relation.isPublishedBy46cabcaa-dd94-4bfe-87b4-55023c1b36d0*
oapen.relation.isbn9783038972846*
oapen.relation.isbn9783038972853*
oapen.pages146*
oapen.edition1st*


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Except where otherwise noted, this item's license is described as https://creativecommons.org/licenses/by-nc-nd/4.0/