Optical In-Process Measurement Systems
| dc.contributor.editor | Fischer, Andreas | |
| dc.date.accessioned | 2022-06-21T08:37:00Z | |
| dc.date.available | 2022-06-21T08:37:00Z | |
| dc.date.issued | 2022 | |
| dc.identifier | ONIX_20220621_9783036538495_39 | |
| dc.identifier.uri | https://directory.doabooks.org/handle/20.500.12854/84461 | |
| dc.description.abstract | Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process measurements. Presented within this book is a selection of promising optical measurement approaches for real-world applications. | |
| dc.language | English | |
| dc.subject.classification | thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues | en_US |
| dc.subject.classification | thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology | en_US |
| dc.subject.other | speckle photography | |
| dc.subject.other | in-process measurement | |
| dc.subject.other | deep rolling process | |
| dc.subject.other | generalized phase shifting interferometry | |
| dc.subject.other | dual-aperture common-path interferometer | |
| dc.subject.other | real-time optical instrumentation | |
| dc.subject.other | optomechatronic systems | |
| dc.subject.other | electrical steel | |
| dc.subject.other | optical coherence tomography | |
| dc.subject.other | OCT | |
| dc.subject.other | scanning | |
| dc.subject.other | process monitoring | |
| dc.subject.other | laser material processing | |
| dc.subject.other | spot compensation | |
| dc.subject.other | low coherence interferometry | |
| dc.subject.other | LCI | |
| dc.subject.other | wind lidar | |
| dc.subject.other | Doppler lidar | |
| dc.subject.other | bistatic | |
| dc.subject.other | metrology | |
| dc.subject.other | traceability | |
| dc.subject.other | wind energy | |
| dc.subject.other | meteorology | |
| dc.subject.other | diffraction grating | |
| dc.subject.other | grating pitch | |
| dc.subject.other | mode-locked femtosecond laser | |
| dc.subject.other | laser diffraction | |
| dc.subject.other | diffraction equation | |
| dc.subject.other | measurement uncertainty analysis | |
| dc.subject.other | image processing | |
| dc.subject.other | pattern recognition | |
| dc.subject.other | wind energy turbines | |
| dc.subject.other | turbulence wedges | |
| dc.subject.other | coherence scanning interferometry | |
| dc.subject.other | in-process application | |
| dc.subject.other | Mirau interferometer | |
| dc.subject.other | vibration compensation | |
| dc.subject.other | interferometric distance sensor | |
| dc.subject.other | optical path length modulation | |
| dc.subject.other | oscillating reference mirror | |
| dc.subject.other | hairpin | |
| dc.subject.other | laser welding | |
| dc.subject.other | semantic segmentation | |
| dc.subject.other | dilated convolution | |
| dc.subject.other | sdu-net | |
| dc.subject.other | spatter detection | |
| dc.subject.other | quality assurance | |
| dc.subject.other | fast prediction time | |
| dc.subject.other | in situ measurement | |
| dc.subject.other | optical metrology | |
| dc.subject.other | quality control | |
| dc.subject.other | interferometry | |
| dc.subject.other | fringe projection | |
| dc.subject.other | computational shear interferometry | |
| dc.subject.other | coherence function | |
| dc.subject.other | structure function | |
| dc.subject.other | additive manufacturing | |
| dc.subject.other | medium voltage switchgear | |
| dc.subject.other | SF6 alternatives | |
| dc.subject.other | UV-Vis spectroscopy | |
| dc.subject.other | gas mixing modeling | |
| dc.subject.other | multicomponent diffusion analysis | |
| dc.subject.other | explosion | |
| dc.subject.other | coal dust | |
| dc.subject.other | methane | |
| dc.subject.other | explosion suppression | |
| dc.subject.other | spectral characteristics | |
| dc.subject.other | explosion pressure | |
| dc.subject.other | radiation intensity | |
| dc.subject.other | free radicals | |
| dc.subject.other | n/a | |
| dc.title | Optical In-Process Measurement Systems | |
| dc.type | book | |
| oapen.identifier.doi | 10.3390/books978-3-0365-3850-1 | |
| oapen.relation.isPublishedBy | 46cabcaa-dd94-4bfe-87b4-55023c1b36d0 | |
| oapen.relation.isbn | 9783036538495 | |
| oapen.relation.isbn | 9783036538501 | |
| oapen.pages | 194 | |
| oapen.place.publication | Basel |
Fichier(s) constituant ce document
| Fichiers | Taille | Format | Vue |
|---|---|---|---|
|
Il n'y a pas de fichiers associés à ce document. |
|||

