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Challenges and New Trends in Power Electronic Devices Reliability

dc.contributor.editorFalco, Pasquale De
dc.contributor.editorChiodo, Elio
dc.contributor.editorDi Noia, Luigi Pio
dc.date.accessioned2022-01-11T13:28:12Z
dc.date.available2022-01-11T13:28:12Z
dc.date.issued2021
dc.identifierONIX_20220111_9783036511771_42
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/76306
dc.description.abstractThe rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components.
dc.languageEnglish
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issuesen_US
dc.subject.classificationthema EDItEUR::K Economics, Finance, Business and Management::KN Industry and industrial studies::KNB Energy industries and utilitiesen_US
dc.subject.otherphotovoltaic system
dc.subject.otherbattery
dc.subject.otherDC-coupled configuration
dc.subject.otherAC-coupled configuration
dc.subject.othermission profile
dc.subject.otherreliability
dc.subject.otherLED
dc.subject.otherthermal cycling test
dc.subject.otheraccelerated test
dc.subject.othersolder joint
dc.subject.othercracks
dc.subject.othercurrent harmonics
dc.subject.othervoltage harmonics
dc.subject.otherpower electronic converters
dc.subject.othercables
dc.subject.othercapacitors
dc.subject.otherPPS
dc.subject.otherhigh-power thyristors
dc.subject.otherreverse recovery currents
dc.subject.otherelectromagnetic launching field
dc.subject.othersegmented LSTM
dc.subject.othermicrogrid inverter
dc.subject.otherIGBT reliability
dc.subject.otheronline evaluation
dc.subject.otherfusion algorithm
dc.subject.othermulti-chip IGBT module
dc.subject.otherbond wire
dc.subject.othermodule transconductance
dc.subject.othertemperature calibration
dc.subject.otherfailure monitoring
dc.subject.othersensor lamp
dc.subject.otherlow-light mode
dc.subject.otherhigh-light mode
dc.subject.otherAC motor drive
dc.subject.otherjunction temperature
dc.subject.otherlifetime prediction
dc.subject.otherpower MOSFET
dc.subject.otherloss modeling
dc.subject.otherSiC MOSFET
dc.subject.otherAlGaN/GaN HEMT
dc.subject.othercascode structure
dc.subject.othersingle event effects
dc.subject.othertechnology computer-aided design simulation
dc.subject.otherheavy-ion irradiation experiment
dc.subject.otherphotovoltaic systems
dc.subject.otherDC/AC converter
dc.subject.othermaintenance
dc.subject.otherpower system faults
dc.subject.otheravailability
dc.subject.othercondition monitoring
dc.subject.otherpower device
dc.subject.otherpower electronics
dc.subject.othern/a
dc.titleChallenges and New Trends in Power Electronic Devices Reliability
dc.typebook
oapen.identifier.doi10.3390/books978-3-0365-1176-4
oapen.relation.isPublishedBy46cabcaa-dd94-4bfe-87b4-55023c1b36d0
oapen.relation.isbn9783036511771
oapen.relation.isbn9783036511764
oapen.pages207
oapen.place.publicationBasel, Switzerland


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