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dc.contributor.authorLeroux, Paul*
dc.date.accessioned2021-02-12T00:45:45Z
dc.date.available2021-02-12T00:45:45Z
dc.date.issued2019*
dc.date.submitted2019-12-09 11:49:15*
dc.identifier42499*
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/57568
dc.description.abstractResearch on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.*
dc.languageEnglish*
dc.subjectTA1-2040*
dc.subjectTK1-9971*
dc.subjectT1-995*
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technologyen_US
dc.subject.othersingle event effects*
dc.subject.othern/a*
dc.subject.otherradiation-hardening-by-design (RHBD)*
dc.subject.otherfrequency divider by two*
dc.subject.othersingle event upset*
dc.subject.otherImage processing*
dc.subject.otherCMOS analog integrated circuits*
dc.subject.otherFPGA*
dc.subject.othertotal ionizing dose (TID)*
dc.subject.otherImpulse Sensitive Function*
dc.subject.othersoft error*
dc.subject.otherhardening by design*
dc.subject.otherradiation hardening by design*
dc.subject.otherX-rays*
dc.subject.otherSingle-Event Upsets (SEUs)*
dc.subject.otherline buffer*
dc.subject.otherheavy ions*
dc.subject.otherVHDL*
dc.subject.otherFPGA-based digital controller*
dc.subject.otherradiation hardening by design (RHBD)*
dc.subject.otherradiation hardening*
dc.subject.otherSRAM-based FPGA*
dc.subject.otherproton irradiation*
dc.subject.otherring oscillator*
dc.subject.othersensor readout IC*
dc.subject.otherfault tolerance*
dc.subject.otherspace application*
dc.subject.otherphysical unclonable function*
dc.subject.othervoltage controlled oscillator (VCO)*
dc.subject.otherRing Oscillators*
dc.subject.otheranalog single-event transient (ASET)*
dc.subject.othersingle event opset (SEU)*
dc.subject.otherSEB*
dc.subject.othersingle event upsets*
dc.subject.otherbipolar transistor*
dc.subject.othertotal ionizing dose*
dc.subject.otherprotons*
dc.subject.othertriple modular redundancy (TMR)*
dc.subject.othergain degradation*
dc.subject.otherspace electronics*
dc.subject.othersaturation effect*
dc.subject.otherconfiguration memory*
dc.subject.otherCo-60 gamma radiation*
dc.subject.othertotal ionization dose (TID)*
dc.subject.otherfrequency synthesizers*
dc.subject.otherCMOS*
dc.subject.otherPLL*
dc.subject.otherTDC*
dc.subject.othersingle-event upsets (SEUs)*
dc.subject.otherbandgap voltage reference (BGR)*
dc.subject.other4MR*
dc.subject.othersingle-shot*
dc.subject.othererror rates*
dc.subject.otherRadiation Hardening by Design*
dc.subject.othersoft errors*
dc.subject.otherheavy-ions*
dc.subject.othersingle-event effects (SEE)*
dc.subject.othersingle event transient (SET)*
dc.subject.otherSEE testing*
dc.subject.otherproton irradiation effects*
dc.subject.otherRFIC*
dc.subject.othersingle event upset (SEU)*
dc.subject.otherFMR*
dc.subject.otherionization*
dc.subject.otherradiation tolerant*
dc.subject.othertriplex–duplex*
dc.subject.otherneutron irradiation effects*
dc.subject.otherdigital integrated circuits*
dc.subject.othersingle event gate rupture (SEGR)*
dc.subject.otherpower MOSFETs*
dc.subject.otherring-oscillator*
dc.subject.otherselective hardening*
dc.subject.othervoltage reference*
dc.subject.othernuclear fusion*
dc.subject.otherTMR*
dc.subject.othergamma-rays*
dc.subject.othergamma ray*
dc.subject.otherinstrumentation amplifier*
dc.subject.otherradiation effects*
dc.subject.otherreference circuits*
dc.subject.otherradiation-hardened*
dc.titleRadiation Tolerant Electronics*
dc.typebook
oapen.identifier.doi10.3390/books978-3-03921-280-4*
oapen.relation.isPublishedBy46cabcaa-dd94-4bfe-87b4-55023c1b36d0*
oapen.relation.isbn9783039212804*
oapen.relation.isbn9783039212798*
oapen.pages210*
oapen.edition1st*


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