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dc.contributor.authorSchmitt, Susanne*
dc.date.accessioned2021-02-11T11:14:28Z
dc.date.available2021-02-11T11:14:28Z
dc.date.issued2011*
dc.date.submitted2019-07-30 20:01:57*
dc.identifier34360*
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/44858
dc.description.abstractThe topic of this work are two further developments of the Factorization method for electrical impedance tomography.We present a modification of this method that is capable of detecting mixed inclusions, i.e. both inclusions with a higher as well as inclusions with a lower conductivity than the background medium. In addition, we derive a new method to compute the conductivity inside inclusions after they have been localized.*
dc.languageEnglish*
dc.subjectQA75.5-76.95*
dc.subject.classificationbic Book Industry Communication::U Computing & information technology::UY Computer scienceen_US
dc.subject.otherFactorization Method*
dc.subject.otherInverse Problem*
dc.subject.otherElectrical Impedance Tomography*
dc.titleDetection and characterization of inclusions in impedance tomography*
dc.typebook
oapen.identifier.doi10.5445/KSP/1000021838*
oapen.relation.isPublishedBy68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2*
oapen.relation.isbn9783866446359*
oapen.pagesVIII, 135 p.*
peerreview.review.typeFull text
peerreview.anonymityAll identities known
peerreview.reviewer.typeInternal editor
peerreview.reviewer.typeExternal peer reviewer
peerreview.review.stagePre-publication
peerreview.open.reviewNo
peerreview.publish.responsibilityScientific or Editorial Board
peerreview.id8ad5c235-9810-49eb-b358-27c8675324d9
peerreview.titleDissertations (Dissertationen)


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Except where otherwise noted, this item's license is described as https://creativecommons.org/licenses/by-nc-nd/4.0/