Show simple item record

dc.contributor.editorZambelli, Cristian
dc.contributor.editorMicheloni, Rino
dc.date.accessioned2022-03-21T16:27:00Z
dc.date.available2022-03-21T16:27:00Z
dc.date.issued2022
dc.identifierONIX_20220321_9783036530123_17
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/79581
dc.description.abstractFlash memory devices have represented a breakthrough in storage since their inception in the mid-1980s, and innovation is still ongoing. The peculiarity of such technology is an inherent flexibility in terms of performance and integration density according to the architecture devised for integration. The NOR Flash technology is still the workhorse of many code storage applications in the embedded world, ranging from microcontrollers for automotive environment to IoT smart devices. Their usage is also forecasted to be fundamental in emerging AI edge scenario. On the contrary, when massive data storage is required, NAND Flash memories are necessary to have in a system. You can find NAND Flash in USB sticks, cards, but most of all in Solid-State Drives (SSDs). Since SSDs are extremely demanding in terms of storage capacity, they fueled a new wave of innovation, namely the 3D architecture. Today “3D” means that multiple layers of memory cells are manufactured within the same piece of silicon, easily reaching a terabit capacity. So far, Flash architectures have always been based on "floating gate," where the information is stored by injecting electrons in a piece of polysilicon surrounded by oxide. On the contrary, emerging concepts are based on "charge trap" cells. In summary, flash memory devices represent the largest landscape of storage devices, and we expect more advancements in the coming years. This will require a lot of innovation in process technology, materials, circuit design, flash management algorithms, Error Correction Code and, finally, system co-design for new applications such as AI and security enforcement.
dc.languageEnglish
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issuesen_US
dc.subject.otherretention characteristic
dc.subject.otherhigh-κ
dc.subject.othernonvolatile charge-trapping memory
dc.subject.otherstack engineering
dc.subject.otherNOR flash memory
dc.subject.otheraluminum oxide
dc.subject.otherNAND flash memory
dc.subject.otherinterference
dc.subject.otherTechnology Computer Aided Design (TCAD) simulation
dc.subject.otherdisturbance
dc.subject.otherprogram
dc.subject.othernon-volatile memory (NVM)
dc.subject.other3D NAND Flash memories
dc.subject.otherrandom telegraph noise
dc.subject.otherFlash memory reliability
dc.subject.othertest platform
dc.subject.otherendurance
dc.subject.othersupport vector machine
dc.subject.otherraw bit error
dc.subject.other3D NAND Flash
dc.subject.otherRBER
dc.subject.otherreliability
dc.subject.otherflash signal processing
dc.subject.otherrandomization scheme
dc.subject.othersolid-state drives
dc.subject.other3D flash memory
dc.subject.otherperformance cliff
dc.subject.othertail latency
dc.subject.othergarbage collection
dc.subject.otherartificial neural network
dc.subject.othererror correction code
dc.subject.otherwork function
dc.subject.othereffective work function
dc.subject.otherdipole
dc.subject.othermetal gate
dc.subject.otherhigh-k
dc.subject.otherSiO2
dc.subject.otherinterfacial reaction
dc.subject.otherMHONOS
dc.subject.othererase performance
dc.subject.other3D NAND flash memory
dc.subject.othertemperature
dc.subject.otherread disturb
dc.subject.othern/a
dc.titleFlash Memory Devices
dc.typebook
oapen.identifier.doi10.3390/books978-3-0365-3013-0
oapen.relation.isPublishedBy46cabcaa-dd94-4bfe-87b4-55023c1b36d0
oapen.relation.isbn9783036530123
oapen.relation.isbn9783036530130
oapen.pages144
oapen.place.publicationBasel


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

https://creativecommons.org/licenses/by/4.0/
Except where otherwise noted, this item's license is described as https://creativecommons.org/licenses/by/4.0/