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dc.contributor.editorSingh, Devinder
dc.contributor.editorCondurache-Bota, Simona
dc.date.accessioned2021-04-20T16:19:52Z
dc.date.available2021-04-20T16:19:52Z
dc.date.issued2020
dc.identifierONIX_20210420_9781838801908_2976
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/67616
dc.description.abstractIn the quantitative determination of new structures, micro-/nano-crystalline materials pose significant challenges. The different properties of materials are structure-dependent. Traditionally, X-ray crystallography has been used for the analysis of these materials. Electron diffraction is a technique that complements other techniques; for example, single crystal X-ray diffraction and powder X-ray diffraction for determination of structure. Electron diffraction plays a very important role when crystals are very small using single crystal X-ray diffraction or very complex for structure solution by powder X-ray diffraction. With the introduction of advanced methodologies, important methods for crystal structural analysis in the field of electron crystallography have been discovered, such as rotation electron diffraction (RED) and automated electron diffraction tomography (ADT). In recent years, large numbers of crystal structures have been solved using electron crystallography.
dc.languageEnglish
dc.subject.classificationthema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometryen_US
dc.subject.otherCrystallography
dc.titleElectron Crystallography
dc.typebook
oapen.identifier.doi10.5772/intechopen.83201
oapen.relation.isPublishedBy78a36484-2c0c-47cb-ad67-2b9f5cd4a8f6
oapen.relation.isbn9781838801908
oapen.relation.isbn9781838801892
oapen.relation.isbn9781839682841
oapen.imprintIntechOpen
oapen.pages114


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