Show simple item record

dc.contributor.authorIgor Djerdj (Ed.)*
dc.date.accessioned2021-02-12T02:18:28Z
dc.date.available2021-02-12T02:18:28Z
dc.date.issued2019*
dc.date.submitted2019-01-28 10:16:11*
dc.identifier32110*
dc.identifier.urihttps://directory.doabooks.org/handle/20.500.12854/58480
dc.description.abstractThis Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.*
dc.languageEnglish*
dc.subjectQD1-999*
dc.subjectQD71-142*
dc.subject.otherRietveld method*
dc.subject.otherStructural characterization*
dc.subject.otherMicrostructural analysis*
dc.subject.otherCrystalline materials*
dc.subject.otherStructural materials*
dc.subject.otherX-ray and neutron diffraction*
dc.subject.otherFunctional materials*
dc.titleRietveld Refinement in the Characterization of Crystalline Materials*
dc.typebook
oapen.identifier.doi10.3390/books978-3-03897-528-1*
oapen.relation.isPublishedBy46cabcaa-dd94-4bfe-87b4-55023c1b36d0*
oapen.relation.isbn9783038975281*
oapen.relation.isbn9783038975274*
oapen.pages88*
oapen.edition1st*


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

https://creativecommons.org/licenses/by-nc-nd/4.0/
Except where otherwise noted, this item's license is described as https://creativecommons.org/licenses/by-nc-nd/4.0/