Ellipsometry - Principles and Techniques for Materials Characterization

dc.contributor.author	Faustino Wahaia	*
dc.date.accessioned	2021-02-11T12:24:11Z
dc.date.available	2021-02-11T12:24:11Z
dc.date.issued	2017	*
dc.date.submitted	2019-10-03 07:51:50	*
dc.identifier	37000	*
dc.identifier.uri	https://directory.doabooks.org/handle/20.500.12854/46217
dc.description.abstract	Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.	*
dc.language	English	*
dc.subject	QC350-467	*
dc.subject.other	Physical Sciences	*
dc.subject.other	Engineering and Technology	*
dc.subject.other	Optoelectronics	*
dc.subject.other	Physics	*
dc.subject.other	Optics and Lasers	*
dc.title	Ellipsometry - Principles and Techniques for Materials Characterization	*
dc.type	book
oapen.identifier.doi	10.5772/65558	*
oapen.relation.isPublishedBy	78a36484-2c0c-47cb-ad67-2b9f5cd4a8f6	*
oapen.relation.isbn	9789535136248	*
oapen.relation.isbn	9789535136231	*
oapen.pages	162	*
oapen.edition	1st Edition	*

Files in this item

Files	Size	Format	View
There are no files associated with this item.