TY  - BOOK
AU  - Henkel, Jörg
AU  - Dutt, Nikil
ED  - Henkel, Jörg
ED  - Dutt, Nikil
AB  - This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
DO  - 10.1007/978-3-030-52017-5
ID  - OAPEN ID: ONIX_20201214_9783030520175_17
ID  - OAPEN ID: 51137
ID  - OAPEN ID: https://library.oapen.org/handle/20.500.12657/43279
KW  - Circuits and Systems
KW  - Cyber-physical systems, IoT
KW  - Processor Architectures
KW  - Electronic Circuits and Systems
KW  - Cyber-Physical Systems
KW  - Fault-Tolerant Computing
KW  - Reliability Enhancers in Embedded Systems
KW  - SoCs based on cross-layer-reliability
KW  - System-Level Reliability Analysis
KW  - Dependable Software Execution
KW  - Open access
KW  - Electronics: circuits & components
KW  - Electrical engineering
KW  - Cybernetics & systems theory
KW  - Computer architecture & logic design
L1  - https://library.oapen.org/bitstream/20.500.12657/43279/1/2021_Book_DependableEmbeddedSystems.pdf
LA  - English
LK  - https://directory.doabooks.org/handle/20.500.12854/33101
PB  - Springer Nature
PY  - 2021
TI  - Dependable Embedded Systemsnull
ER  - 
