TY  - BOOK
AU  - Kuang-Chao Fan (Ed.)
AB  - Coordinate measuring machines (CMMs) have been conventionally used in industry for 3-dimensional and form-error measurements of macro parts for many years. Ever since the first CMM, developed by Ferranti Co. in the late 1950s, they have been regarded as versatile measuring equipment, yet many CMMs on the market still have inherent systematic errors due to the violation of the Abbe Principle in its design. Current CMMs are only suitable for part tolerance above 10 μm. With the rapid advent of ultraprecision technology, multi-axis machining, and micro/nanotechnology over the past twenty years, new types of ultraprecision and micro/nao-CMMs are urgently needed in all aspects of society. This Special Issue accepted papers revealing novel designs and applications of CMMs, including structures, probes, miniaturization, measuring paths, accuracy enhancement, error compensation, etc. Detailed design principles in sciences, and technological applications in high-tech industries, were required for submission. Topics covered, but were not limited to, the following areas: 1. New types of CMMs, such as Abbe-free, multi-axis, cylindrical, parallel, etc. 2. New types of probes, such as touch-trigger, scanning, hybrid, non-contact, microscopic, etc. 3. New types of Micro/nano-CMMs. 4. New types of measuring path strategy, such as collision avoidance, free-form surface, aspheric surface, etc. 5. New types of error compensation strategy.
DO  - 10.3390/books978-3-03842-277-8
ID  - OAPEN ID: 19971
KW  - error compensation
KW  - measuring path
KW  - contact or noncontact probe
KW  - micro/nano-CMM
KW  - coordinate measuring machine
KW  - structural design
KW  - free-form measurement
L1  - http://www.mdpi.com/books/pdfview/book/233
LA  - English
LK  - https://directory.doabooks.org/handle/20.500.12854/44810
PB  - MDPI - Multidisciplinary Digital Publishing Institute
PY  - 2016
SN  - 9783038422778
SN  - 9783038422761
TI  - Design and Applications of Coordinate Measuring Machinesnull
ER  - 
